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Electron microscopy
Results: 1457

#	Item
421	Microsoft Word - syl_ph316_12.doc Add to Reading List Source URL: www.pdx.edu Language: English - Date: 2013-03-09 14:37:10 Research Notebooks Electron microscopy Lab notebook Laboratory Ferrofluid Experiment Pierre-Simon Laplace Electron microscope Physics Science Scientific method
422	2009 ANNUAL REPORT Fiscal year ended March 31, 2009 Profile On the basis of “Creativity” and “Research and Development,” JEOL positively Add to Reading List Source URL: www.jeol.co.jp Language: English - Date: 2012-12-25 02:07:08 JEOL Microscopy Microscope Scientific instrument Electron microscope Electron Optical microscope Nuclear magnetic resonance Scientific method Science Physics
423	Originally developed by Philips/FEI in Eindhoven and further developed by Phenom-World By far the fastest electron microscope requiring no SEM experience Add to Reading List Source URL: www.atascientific.com.au Language: English - Date: 2015-04-20 00:02:46 Electron microscope Microscopes Phenom Electron microscopy
424	CrossMark_Color_Stacked_p Add to Reading List Source URL: vandersypenlab.tudelft.nl Language: English - Date: 2014-05-21 12:26:50 Electron microscopy Electron beam Abrasives Ceramic materials Graphene Electron beam-induced deposition Electron beam lithography Boron nitride Electron microscope Chemistry Matter Superhard materials
425	Fluorescence Quenching: Seeing TwoDimensional Sheets on Arbitrary Substrates by Fluorescence Quenching Microscopy (Small) Add to Reading List Source URL: jxhuang.mccormick.northwestern.edu Language: English - Date: 2013-11-21 09:10:27 Spectroscopy Fluorescence Emerging technologies Nanomaterials Graphene Quenching Atomic force microscopy Microscopy Scanning electron microscope Chemistry Science Scientific method
426	Microsoft Word - Exp PhysicsWinter Syllabus.doc Add to Reading List Source URL: www.pdx.edu Language: English - Date: 2013-03-09 14:35:09 Chemistry Scientific method Electron microscopy Focused ion beam Ultra-high vacuum Machining Ion beam Secondary ion mass spectrometry SB Semiconductor device fabrication Thin film deposition Physics
427	De novo protein structure determination from near-atomic-resolution cryo-EM maps Add to Reading List Source URL: www.bakerlab.org Language: English - Date: 2015-05-17 05:37:25 Bioinformatics Statistics Protein methods Homology modeling Root-mean-square deviation Beta sheet Cryo-electron microscopy UCSF Chimera STING Biology Protein structure Science
428	Microsoft Word - Syllabus Nanometrology Class 2012 Summer - Erik Sanchez.docx Add to Reading List Source URL: www.pdx.edu Language: English - Date: 2013-03-09 14:37:51 Electron microscopy Physics Science Nanotechnology Focused ion beam Ions Ion beam Fib Nanometrology Semiconductor device fabrication Thin film deposition Scientific method
429	Media Release 31 August 2012 A look at what lies within Incredible Inner Space exhibition Add to Reading List Source URL: riaus.org.au Language: English - Date: 2012-09-27 00:10:00 Microbiology Microscope Electron microscope Microscopy Scanning electron microscope Scientific method Science Electron microscopy
430	2005 Fiscal year ended March 31, 2005 ANNUAL REPORT Profile Add to Reading List Source URL: www.jeol.co.jp Language: English - Date: 2012-12-25 02:07:08 Electron microscopy Microscopes JEOL Microscopy X-rays Electron microscope Electron Transmission electron microscopy Optical microscope Scientific method Science Physics

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